Zihua ZhuResearch Scientist, WR Wiley Environmental Molecular Sciences Laboratory, Interface Spectroscopy/Diffraction
http://emslbios.pnl.gov/id/zhu_z Updated: August 19, 2009
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful technique to study a series of interesting scientific questions. Our ultimate objective is to develop state-of-the-art instrumentation technique to resolve those questions which come from the hottest research areas. Current efforts are mainly focused on the following areas: (1) using ToF-SIMS to detect bio-active molecules (peptides, oligo-nucleotides, film molecules, etc.) immobilized on solid substrates; (2) using ToF-SIMS to investigate one-dimensional, two dimensional or three-dimensional distributions of objective molecules in bio- or nano- materials; (3) using ToF-SIMS to study chemical process on surface of solid catalyst; (4) studying interesting phenomena of metal cluster or C60 primary ions on different sample surfaces; (5) modifying instrument to expand capabilities of SIMS analysis.
Dr. Zhu studied organic synthesis before he got his BS degree. During his MS study, he was interested in surface enhanced Raman scattering (SERS), and he investigated some interesting SERS phenomena on Au nanoparticles assemblies. At the Pennsylvania State University, he used ToF-SIMS to study metal behavior on alkanethiol self-assembled monolayers (SAM).
PhD, Analytical Chemistry, Pennsylvania State University, 2006.
MS, Chemistry, Peking University, 2000.
BS, Chemistry, Peking University, 1997.